BS EN 60444-2:1997

BS EN 60444-2:1997


Full Specification Given Below:

Standard BS EN 60444-2:1997
Title Identifier Measurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units
Status CU
Publication Date 15/09/93
Committee EPL/49
Approximate Price 64.00
Notes
ISBN 0 580 22497 X
Pages 20
International Equivalent EN 60444-2:1997 IEC 60444-2:1980
Descriptors Crystal resonators, Resonators, Piezoelectric devices, Dielectric devices, Quartz, Capacitance, Wave properties and phenomena, Capacitance measurement, Errors, Electrical wave measurement, Electrical measurement, Dielectric properties, Phase measurement (electric), Resonant frequency, Frequency measurement, Frequencies, Circuits, Circuit networks, Mathematical calculations
Cross references BS EN 60444-1:1997, IEC 302:1969
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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