BS EN 60749-1:2003

BS EN 60749-1:2003


Full Specification Given Below:

Standard BS EN 60749-1:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. General
Status CU
Publication Date 07/07/03
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 42198 8
Pages 12
International Equivalent EN 60749-1:2003 IEC 60749-1:2002
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Testing conditions
Cross references IEC 60050, IEC 60747, IEC 60748, EN 60747
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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