BS EN 60749-14:2003

BS EN 60749-14:2003


Full Specification Given Below:

Standard BS EN 60749-14:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity)
Status CU
Publication Date 15/12/03
Committee EPL/47
Approximate Price 64.00
Notes
ISBN 0 580 43082 0
Pages 18
International Equivalent EN 60749-14:2003 IEC 60749-14:2003
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Semiconductors, Interfaces, Defects, Tensile testing, Bend testing, Fatigue testing, Torque, Destructive testing, Qualification approval, Testing conditions
Cross references IEC 60749-8, EN 60749-8:2003
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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