BS EN 60749-16:2003

BS EN 60749-16:2003


Full Specification Given Below:

Standard BS EN 60749-16:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Particle impact noise detection (PIND)
Status CU
Publication Date 19/06/03
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 42062 0
Pages 10
International Equivalent EN 60749-16:2003 IEC 60749-16:2003
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Acoustic measurement, Vibration testing, Particulate materials, Noise (spurious signals), Holes, Ceramics, Wires, Solders, Non-destructive testing
Cross references IEC 61340-5-1:1998
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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