BS EN 60749-2:2002

BS EN 60749-2:2002


Full Specification Given Below:

Standard BS EN 60749-2:2002
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Low air pressure
Status CU
Publication Date 24/09/02
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 40397 1
Pages 10
International Equivalent EN 60749-2:2002 IEC 60749-2:2002
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Low-pressure tests, Air, Pressure
Cross references IEC 60068-2-13, EN 60068-2-13:1999
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


To purchase this standard/document, please email
Obtain a Quote for BS, ISO, EN and IEC Standards





Back to Standards Direct