BS EN 60749-23:2004

BS EN 60749-23:2004


Full Specification Given Below:

Standard BS EN 60749-23:2004
Title Identifier Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
Status CU
Publication Date 24/06/04
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 43971 2
Pages 12
International Equivalent EN 60749-23:2004 IEC 60749-23:2004
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Operating conditions, Endurance testing, Life (durability), Accelerated testing, High-temperature testing, Thermal testing, Performance testing, Reliability, Qualification approval
Cross references IEC 60747, EN 60747, IEC 60749-34, EN 60749-34:2004
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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