BS EN 60749-25:2003

BS EN 60749-25:2003


Full Specification Given Below:

Standard BS EN 60749-25:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Temperature cycling
Status CU
Publication Date 30/10/03
Committee EPL/47
Approximate Price 64.00
Notes
ISBN 0 580 42859 1
Pages 16
International Equivalent EN 60749-25:2003 IEC 60749-25:2003
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Thermal testing, Thermal-cycling tests, Heating tests, Testing conditions, Solders
Cross references IEC 60068-2-14:1984, EN 60068-2-14:1999
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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