BS EN 60749-29:2003

BS EN 60749-29:2003


Full Specification Given Below:

Standard BS EN 60749-29:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Latch-up test
Status CU
Publication Date 09/03/04
Committee EPL/47
Approximate Price 92.00
Notes
ISBN 0 580 43523 7
Pages 24
International Equivalent EN 60749-29:2003 IEC 60749-29:2003
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Overvoltage tests, Overvoltage, Electrical faults, Electrical impedance, Electrical testing, Destructive testing, Failure rate
Cross references
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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