BS EN 60749-3:2002

BS EN 60749-3:2002


Full Specification Given Below:

Standard BS EN 60749-3:2002
Title Identifier Semiconductor devices. Mechanical and climatic test methods. External visual examination
Status CU
Publication Date 27/08/02
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 40295 9
Pages 8
International Equivalent EN 60749-3:2002 IEC 60749-3:2002
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Visual inspection (testing), External, Non-destructive testing
Cross references
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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