BS EN 60749-33:2004

BS EN 60749-33:2004


Full Specification Given Below:

Standard BS EN 60749-33:2004
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased autoclave
Status CU
Publication Date 22/06/04
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 43973 9
Pages 10
International Equivalent EN 60749-33:2004 IEC 60749-33:2004
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Solid-state physics, Moisture measurement, Damp-heat tests, Corrosion resistance, Accelerated corrosion tests, Accelerated testing, Destructive testing, Testing conditions, Pressure, Humidity, Temperature
Cross references IEC 60749-24, EN 60749-24:2004
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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