BS EN 60749-36:2003

BS EN 60749-36:2003


Full Specification Given Below:

Standard BS EN 60749-36:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state
Status CU
Publication Date 19/06/03
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 42065 5
Pages 8
International Equivalent EN 60749-36:2003 IEC 60749-36:2003
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Acceleration measurement, Acceleration tests, Impact testing, Destructive testing, Endurance testing, Stress
Cross references IEC 60068-2-7, EN 60068-2-7:1993
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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