BS EN 60749-4:2002

BS EN 60749-4:2002


Full Specification Given Below:

Standard BS EN 60749-4:2002
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
Status CU
Publication Date 10/09/02
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 40335 1
Pages 12
International Equivalent EN 60749-4:2002 IEC 60749-4:2002
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Damp-heat tests, Accelerated testing
Cross references IEC 60749-5
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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