BS EN 60749-5:2003

BS EN 60749-5:2003


Full Specification Given Below:

Standard BS EN 60749-5:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
Status CU
Publication Date 18/06/03
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 42060 4
Pages 12
International Equivalent EN 60749-5:2003 IEC 60749-5:2003
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Damp-heat tests, Watertightness tests, Thermal testing, Endurance testing, Humidity, Destructive testing
Cross references IEC 60749-4, EN 60794-4:2002
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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