BS EN 60749-7:2002

BS EN 60749-7:2002


Full Specification Given Below:

Standard BS EN 60749-7:2002
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases
Status CU
Publication Date 30/08/02
Committee EPL/47
Approximate Price 52.00
Notes
ISBN 0 580 40294 0
Pages 12
International Equivalent EN 60749-7:2002 IEC 60749-7:2002
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Moisture measurement, Gas analysis, Water vapour, Water-vapour tests
Cross references IEC 60749-8, IEC 60749-8
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


To purchase this standard/document, please email
Obtain a Quote for BS, ISO, EN and IEC Standards





Back to Standards Direct