BS EN 60749-8:2003

BS EN 60749-8:2003


Full Specification Given Below:

Standard BS EN 60749-8:2003
Title Identifier Semiconductor devices. Mechanical and climatic test methods. Sealing
Status CU
Publication Date 03/07/03
Committee EPL/47
Approximate Price 64.00
Notes
ISBN 0 580 42201 1
Pages 20
International Equivalent EN 60749-8:2003 IEC 60749-8:2002
Descriptors Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Seals, Leak tests
Cross references IEC 60068-2-17:1994, EN 60068-2-17 1994
Replaces BS EN 60749:1999
Replaces Notes Partially replaces BS EN 60749:1999.
Replaced By
Replaced by Notes


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