BS ISO 14606:2000

BS ISO 14606:2000


Full Specification Given Below:

Standard BS ISO 14606:2000
Title Identifier Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Status CU
Publication Date 15/01/01
Committee CII/60
Approximate Price 92.00
Notes
ISBN 0 580 36853 X
Pages 24
International Equivalent ISO 14606:2000
Descriptors Surface chemistry, Surface properties, Chemical analysis and testing, Depth, Laminates, Profile measurement, Reference conditions, Control samples, Augers, Spectrochemical analysis, Spectroscopy, Electron emission, X-rays, Mass spectrometry, Radiation measurement, Microscopic analysis
Cross references ISO Guide 30:1992, ISO Guide 31:1981, ISO Guide 33:1989, ISO Guide 34:1996, ISO Guide 35:1989, ASTM E 673-97, ASTM E 1438-91:1996, ASTM E 1127-91:1997, ASTM E 684-95
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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