BS ISO 16700:2004

BS ISO 16700:2004


Full Specification Given Below:

Standard BS ISO 16700:2004
Title Identifier Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Status CU
Publication Date 29/09/04
Committee CII/9
Approximate Price 92.00
Notes
ISBN 0 580 44519 4
Pages 26
International Equivalent ISO 16700:2004
Descriptors Scanning electron microscopes, Electron microscopes, Microscopes, Optical instruments, Electron optics, Electron beams, Magnification, Optical phenomena, Calibration, Control samples, Accuracy
Cross references ISO Guide 30:1992, ISO Guide 34:1996, ISO Guide 35:1989, ISO 5725-1:1994, ISO/IEC 17025:1999
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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