DD ENV 50219:1996

DD ENV 50219:1996


Full Specification Given Below:

Standard DD ENV 50219:1996
Title Identifier Description of the reliability test structures of the European mini test chip
Status CU
Publication Date 15/09/96
Committee GEL/93
Approximate Price 64.00
Notes
ISBN 0 580 26037 2
Pages 42
International Equivalent ENV 50219:1996
Descriptors Integrated circuits, Test equipment, Digital integrated circuits, Microprocessor chips, Reliability, Assessed reliability, Semiconductor devices, Failure (quality control), Transistors, Metal oxide semiconductors, Electronic equipment and components, Computer applications, Modules, Systems analysis, Dimensions
Cross references CENELEC Document Ref. No. R 117-001, PD 6595, CENELEC R 117-001, CENELEC R 117-005, CENELEC R 117-006, CENELEC R 117- 'Description of a Parametrized European Mini Test Chip', CENELEC R 117- 'Data Interchange Format for Simulated and Measured Data (ISMD)', CENELEC 'R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip', CENELEC R 117- 'Evaluation of the Reliability Test Structures of the European Mini Test Chip'
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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