BS 9300:1969

BS 9300:1969


Full Specification Given Below:

Standard BS 9300:1969
Title Identifier Specification for semiconductor devices of assessed quality: generic data and methods of test
Status CU
Publication Date 31/07/69
Committee EPL/47
Approximate Price 148.00
Notes
ISBN 0 580 05681 3
Pages 584
International Equivalent
Descriptors Semiconductor devices, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Quality factor, Inspection, Specification (approval), Definitions, Marking, Colour codes, Sampling methods, Ratings, Rated voltage, Visual inspection (testing), Testing conditions, Defects, Environmental testing, Fire tests, Flammability, Mechanical testing, Solvent-resistance tests, Adhesion tests, Leak tests, Electrical testing, Electrical measurement, Test equipment, Circuits, Performance testing, Thermal testing, Accelerated testing, Detail specification, Quality control, Statistical quality control, Temperature measurement, Voltage measurement, Current measurement, Charge measurement, Capacitance measurement, Resistance measurement, Impedance measurement, Power measurement (electric), Noise (spurious signals), Sensitivity, Inductance measurement, Frequency measurement, Time measurement, Thermal-cycling tests, Endurance testing, Encapsulated, Diodes, Transistors, Oscillators, Semiconductor diodes, Suppressors, Pulse circuits, Variable capacitors, Power factor, Microwave devices, Detectors (circuits), Receivers, Attenuation, Radiofrequencies, Pulse generators, Avalanche diodes, Rectifier diodes, Thyristors, Transistors, Breakdown voltage, Microwaves, Power gain, Field-effect transistors
Cross references BS 2011, BS 3363, BS 3934, BS 3939, BS 4000, BS 4727, BS 5295, BS 6001, BS 9000:Part 1, PD 6460, IEC 134
Replaces
Replaces Notes Replaces BS 3494:Part 1:1967 and BS 3494:Part 2:1966.
Replaced By BS CECC 50000:1987
Replaced by Notes Replaced by BS CECC 50000:1987 but remains current due to existing approvals.


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