BS CECC 00013:1985

BS CECC 00013:1985


Full Specification Given Below:

Standard BS CECC 00013:1985
Title Identifier Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
Status CU
Publication Date 30/08/85
Committee ECL/-
Approximate Price 92.00
Notes
ISBN 0 580 14602 2
Pages 28
International Equivalent CECC 00013
Descriptors Electronic equipment and components, Semiconductors, Semiconductor devices, Integrated circuits, Semiconductor technology, Integrated circuit technology, Quality assurance systems, Assessed quality, Approval testing, Inspection, Specification (approval), Microscopic analysis, Electron microscopes, Non-destructive testing, Test equipment, Testing conditions, Sampling methods, Statistical quality control, Quality control, Specimen preparation
Cross references
Replaces
Replaces Notes
Replaced By
Replaced by Notes


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