BS CECC 50000:1987

BS CECC 50000:1987


Full Specification Given Below:

Standard BS CECC 50000:1987
Title Identifier Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Status CU
Publication Date 30/10/87
Committee EPL/47
Approximate Price 140.00
Notes
ISBN 0 580 16263 X
Pages 154
International Equivalent CECC 50000:1986
Descriptors Semiconductor devices, Semiconductor diodes, Semiconductor rectifiers, Transistors, Thyristors, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Marking, Colour codes, Designations, Sampling methods, Testing conditions, Electrical testing, Environmental testing, Mechanical testing, Orientation, Leak tests, Endurance testing, Statistical quality control, Quality control, Electrical measurement, Breakdown voltage, Voltage measurement, Test equipment, Circuits, Performance testing, Transient voltages, Power measurement (electric), Noise (spurious signals), Current measurement, Capacitance measurement, Visual inspection (testing), Approval testing, Inspection, Specification (approval), Capability approval, Acceptance (approval), Thermal testing, Accelerated testing, Heat of activation
Cross references BS 2011, BS 2045, BS 3363, BS 3934, BS 3939, BS 4727, BS 4760, BS 5555, BS 5775, BS 6001, BS 9000:Part 2, BS 9300, BS E9007, IEC 134, BS 9000:Part 1, IEC 68-1, IEC 68-2-2, IEC 68-2-2A, IEC 68-2-3, IEC 68-2-6, IEC 68-2-7, IEC 68-2-14, IEC 68-2-17, IEC 68-2-20, IEC 68-2-21, IEC 68-2-27, IEC 68-2-38, IEC 68-2-45, CECC 00102, CECC 00103, CECC 00106, CECC 00107, CECC 00108, CECC 00109, CECC 00110, CECC 00111, CECC 00112, CECC 00113
Replaces BS 9300:1969 BS CECC 50000:1981
Replaces Notes Replaces BS 9300:1969 which remains current due to existing approvals.
Replaced By
Replaced by Notes


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